The effect of interface roughness scattering on Si SOI FinFET with Ando's and extended Prange and Nee model

  1. Nagy, D.
  2. Elmessary, M.A.
  3. Aldegunde, M.
  4. Kalna, K.
Proceedings:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Year of publication: 2015

Volume: 647

Issue: 1

Type: Conference paper

DOI: 10.1088/1742-6596/647/1/012065 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus