Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy

  1. Lai, W.
  2. Cao, H.
  3. Yang, J.
  4. Deng, G.
  5. Yin, Z.
  6. Zhang, Q.
  7. Pelaz, B.
  8. Del Pino, P.
Journal:
Optics Express

ISSN: 1094-4087

Year of publication: 2018

Volume: 26

Issue: 15

Pages: 19470-19478

Type: Article

DOI: 10.1364/OE.26.019470 GOOGLE SCHOLAR
Data source: Scopus