Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG

  1. Indalecio, G.
  2. Garcia-Loureiro, A.
  3. Aldegunde, M.
  4. Kalna, K.
Proceedings:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

ISBN: 9781467346689

Year of publication: 2013

Pages: 95-98

Type: Conference paper

DOI: 10.1109/CDE.2013.6481351 DIALNET GOOGLE SCHOLAR
Data source: Scopus