Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG
- Indalecio, G.
- Garcia-Loureiro, A.
- Aldegunde, M.
- Kalna, K.
Konferenzberichte:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
ISBN: 9781467346689
Datum der Publikation: 2013
Seiten: 95-98
Art: Konferenz-Beitrag