Dopants and roughness induced resonances in thin Si nanowire transistors: A self-consistent NEGF-poisson study

  1. Martinez, A.
  2. Barker, R.
  3. Seoane, N.
  4. Brown, R.
  5. Asenov, A.
Actas:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Ano de publicación: 2010

Volume: 220

Número: 1

Tipo: Achega congreso

DOI: 10.1088/1742-6596/220/1/012009 GOOGLE SCHOLAR
Fonte de datos: Scopus