Dopants and roughness induced resonances in thin Si nanowire transistors: A self-consistent NEGF-poisson study
- Martinez, A.
- Barker, R.
- Seoane, N.
- Brown, R.
- Asenov, A.
ISSN: 1742-6596, 1742-6588
Year of publication: 2010
Volume: 220
Issue: 1
Type: Conference paper