Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green's function techniques

  1. Asenov, A.
  2. Brown, A.R.
  3. Roy, G.
  4. Cheng, B.
  5. Alexander, C.
  6. Riddet, C.
  7. Kovac, U.
  8. Martinez, A.
  9. Seoane, N.
  10. Roy, S.
Journal:
Journal of Computational Electronics

ISSN: 1572-8137 1569-8025

Year of publication: 2009

Volume: 8

Issue: 3-4

Pages: 349-373

Type: Article

DOI: 10.1007/S10825-009-0292-0 GOOGLE SCHOLAR