Impact of intrinsic parameter fluctuations on the performance of In 0.75Ga0.25As implant free MOSFETs

  1. Seoane, N.
  2. Garcia-Loureiro, A.
  3. Aldegunde, M.
  4. Kalna, K.
  5. Asenov, A.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242,  1361-6641

Year of publication: 2009

Volume: 24

Issue: 5

Type: Article

DOI: 10.1088/0268-1242/24/5/055011 GOOGLE SCHOLAR
Data source: Scopus