Publicaciones en las que colabora con Marc Porti Pujal (5)

2021

  1. Methodology for the Simulation of the Variability of MOSFETs with Polycrystalline High-k Dielectrics Using CAFM Input Data

    IEEE Access, Vol. 9, pp. 90568-90576

  2. Methodology for the simulation of the variability of MOSFETs with polycrystalline high-k dielectrics using CAFM input data

    IEEE Access

2019

  1. Combined nanoscale KPFM characterization and device simulation for the evaluation of the MOSFET variability related to metal gate workfunction fluctuations

    Microelectronic Engineering, Vol. 216

  2. Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability

    Applied Physics Letters, Vol. 114, Núm. 9

2017

  1. Local Defect Density in Polycrystalline High-k Dielectrics: CAFM-Based Evaluation Methodology and Impact on MOSFET Variability

    IEEE Electron Device Letters, Vol. 38, Núm. 5, pp. 637-640