Publicacións nas que colabora con XESUS PRIETO BLANCO (17)

2014

  1. Compact Offner-Wynne imaging spectrometers

    Optics Communications, Vol. 328, pp. 143-150

2012

  1. Pupil aberrations in Offner spectrometers

    Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 29, Núm. 4, pp. 442-449

2011

  1. Design of Dyson imaging spectrometers based on the Rowland circle concept

    Applied Optics, Vol. 50, Núm. 35, pp. 6487-6494

  2. Design, calibration and assembly of an Offner imaging spectrometer

    Journal of Physics: Conference Series

  3. Differential ray tracing analysis of the Schwarzschild objective

    Proceedings of SPIE - The International Society for Optical Engineering

  4. Measurement of lateral chromatic aberration by using an imaging spectrometer

    Proceedings of SPIE - The International Society for Optical Engineering

  5. Off-plane anastigmatic imaging in Offner spectrometers

    Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 28, Núm. 11, pp. 2332-2339

  6. Schwarzschild spectrometer

    Applied Optics, Vol. 50, Núm. 16, pp. 2418-2424

2010

  1. The Offner imaging spectrometer in quadrature

    Optics Express, Vol. 18, Núm. 12, pp. 12756-12769

  2. Two-wavelength anastigmatic Dyson imaging spectrometers

    Optics Letters, Vol. 35, Núm. 14, pp. 2379-2381

2009

  1. Imaging with classical spherical diffraction gratings: The quadrature configuration

    Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 26, Núm. 11, pp. 2400-2409

2008

  1. Optical configurations for imaging spectrometers

    Studies in Computational Intelligence, Vol. 133, pp. 1-25

2006

  1. A windowing/pushbroom hyperspectral imager

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  2. Analytical design of an Offner imaging spectrometer

    Optics Express, Vol. 14, Núm. 20, pp. 9156-9168

1996

  1. Interferometric characterization method of lateral ion exchange for refractive waveguide elements

    Pure and Applied Optics (Print edition) (United Kingdom), Vol. 5, Núm. 6, pp. 919-928