Differential ray tracing analysis of the Schwarzschild objective

  1. Prieto-Blanco, X.
  2. Mouriz, D.
  3. González Núñez, H.
  4. Lopez Lago, E.
  5. De La Fuente, R.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819485755

Ano de publicación: 2011

Volume: 8001

Tipo: Achega congreso

DOI: 10.1117/12.892018 GOOGLE SCHOLAR