Study of local power dissipation in ultrascaled silicon nanowire FETs

  1. Martinez, A.
  2. Barker, J.R.
  3. Aldegunde, M.
  4. Valin, R.
Journal:
IEEE Electron Device Letters

ISSN: 0741-3106

Year of publication: 2015

Volume: 36

Issue: 1

Pages: 2-4

Type: Article

DOI: 10.1109/LED.2014.2368357 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus