What do we know about the Defect Types detected in Conceptual Models?

  1. Granda, Maria Fernanda
  2. Condori-Fernandez, Nelly
  3. Vos, Tanja E. J.
  4. Pastor, Oscar
Colección de libros:
2015 IEEE 9TH INTERNATIONAL CONFERENCE ON RESEARCH CHALLENGES IN INFORMATION SCIENCE (RCIS)
  1. Rolland, C (coord.)
  2. Anagnostopoulos, D (coord.)
  3. Loucopoulos, P (coord.)
  4. GonzalezPerez, C (coord.)

ISSN: 2151-1357

ISBN: 978-1-4673-6630-4

Ano de publicación: 2015

Páxinas: 88-99

Congreso: IEEE 9th International Conference on Research Challenges in Information Science (RCIS)

Tipo: Achega congreso

GOOGLE SCHOLAR
Fonte de datos: WoS