What do we know about the Defect Types detected in Conceptual Models?

  1. Granda, Maria Fernanda
  2. Condori-Fernandez, Nelly
  3. Vos, Tanja E. J.
  4. Pastor, Oscar
Book Series:
2015 IEEE 9TH INTERNATIONAL CONFERENCE ON RESEARCH CHALLENGES IN INFORMATION SCIENCE (RCIS)
  1. Rolland, C (coord.)
  2. Anagnostopoulos, D (coord.)
  3. Loucopoulos, P (coord.)
  4. GonzalezPerez, C (coord.)

ISSN: 2151-1357

ISBN: 978-1-4673-6630-4

Year of publication: 2015

Pages: 88-99

Congress: IEEE 9th International Conference on Research Challenges in Information Science (RCIS)

Type: Conference paper

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Data source: WoS