Radius measurement via super-resolution microscopy enables the development of a variable radii proximity labeling platform

  1. Oakley, J.V.
  2. Buksh, B.F.
  3. Fernández, D.F.
  4. Oblinsky, D.G.
  5. Seath, C.P.
  6. Geri, J.B.
  7. Scholes, G.D.
  8. MacMillan, D.W.C.
Revista:
Proceedings of the National Academy of Sciences of the United States of America

ISSN: 1091-6490,  0027-8424

Ano de publicación: 2022

Volume: 119

Número: 32

Tipo: Artigo

DOI: 10.1073/PNAS.2203027119 GOOGLE SCHOLAR lock_openAcceso aberto editor
Fonte de datos: Scopus