Radius measurement via super-resolution microscopy enables the development of a variable radii proximity labeling platform
- Oakley, J.V.
- Buksh, B.F.
- Fernández, D.F.
- Oblinsky, D.G.
- Seath, C.P.
- Geri, J.B.
- Scholes, G.D.
- MacMillan, D.W.C.
ISSN: 1091-6490, 0027-8424
Datum der Publikation: 2022
Ausgabe: 119
Nummer: 32
Art: Artikel