Analysis of Fluctuation Sensitivity Map Algorithms Applied to a 10nm GAA NW FET

  1. Andrés, P.
  2. Seoane, N.
  3. García-Loureiro, A.J.
  4. Indalecio, G.
Actas:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

ISBN: 9781538657799

Ano de publicación: 2018

Tipo: Achega congreso

DOI: 10.1109/CDE.2018.8597155 GOOGLE SCHOLAR
Fonte de datos: Scopus