Analysis of Fluctuation Sensitivity Map Algorithms Applied to a 10nm GAA NW FET
- Andrés, P.
- Seoane, N.
- García-Loureiro, A.J.
- Indalecio, G.
Konferenzberichte:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018
ISBN: 9781538657799
Datum der Publikation: 2018
Art: Konferenz-Beitrag