Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition

1. Arosa, Y.
2. Lago, E.L.
3. Varela, L.M.
4. De La Fuente, R.

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DOI: 10.1364/OE.24.017303 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus