Investigation of resistance in n-doped Si wires using NEGF formalism
- Martinez, A.
- Brown, A.
- Seoane, N.
- Asenov, A.
Proceedings:
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
ISBN: 9781424428397
Year of publication: 2009
Pages: 416-419
Type: Conference paper