Advanced simulation of statistical variability and reliability in nano CMOS transistors

1. Asenov, A.
2. Roy, S.
3. Brown, R.A.
4. Roy, G.
5. Alexander, C.
6. Riddet, C.
7. Millar, C.
8. Cheng, B.
9. Martinez, A.
10. Seoane, N.
11. Reid, D.
12. Bukhori, M.F.
13. Wang, X.
14. Kovac, U.