Analysis of the impact of intrinsic parameter fluctuations in a 50 nm InP HEMT
- Seoane, N.
- García-Loureiro, A.
- Kalna, K.
- Asenov, A.
Proceedings:
2007 Spanish Conference on Electron Devices, Proceedings
ISBN: 9781424408689
Year of publication: 2007
Pages: 92-95
Type: Conference paper