Intrinsic fluctuations induced by a high-κ gate dielectric in sub-100 nm Si MOSFETs
- García-Loureiro, A.J.
- Kalna, K.
- Asenov, A.
ISSN: 0094-243X, 1551-7616
ISBN: 9780735402676
Year of publication: 2005
Volume: 780
Pages: 239-242
Type: Conference paper