3D NEGF simulation of 'ab initio' scattering from discrete dopants in the source and drain of a nanowire transistor

  1. Seoane, N.
  2. Martinez, A.
  3. Brown, A. R.
  4. Barker, J. R.
  5. Asenov, A.
Libro:
2008 IEEE SILICON NANOELECTRONICS WORKSHOP

ISBN: 978-1-4244-2071-1

Ano de publicación: 2008

Páxinas: 47-48

Congreso: IEEE Silicon Nanoelectronics Workshop (SNW 2008)

Tipo: Achega congreso