Multilevel 3-D Device Simulation Approach Applied to Deeply Scaled Nanowire Field Effect Transistors

  1. Seoane, N.
  2. Kalna, K.
  3. Cartoixa, X.
  4. Garcia-Loureiro, A.
Journal:
IEEE Transactions on Electron Devices

ISSN: 1557-9646,  0018-9383

Year of publication: 2022

Volume: 69

Issue: 9

Pages: 5276-5282

Type: Article

DOI: 10.1109/TED.2022.3188945 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus