The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision

1. Padgett, E.
2. Holtz, M.E.
3. Cueva, P.
4. Shao, Y.-T.
5. Langenberg, E.
6. Schlom, D.G.
7. Muller, D.A.