Charge-changing cross-section measurements of C 12-16 at around 45A MeV and development of a Glauber model for incident energies 10A-2100A MeV
- Tran, D.T.
- Ong, H.J.
- Nguyen, T.T.
- Tanihata, I.
- Aoi, N.
- Ayyad, Y.
- Chan, P.Y.
- Fukuda, M.
- Hashimoto, T.
- Hoang, T.H.
- Ideguchi, E.
- Inoue, A.
- Kawabata, T.
- Khiem, L.H.
- Lin, W.P.
- Matsuta, K.
- Mihara, M.
- Momota, S.
- Nagae, D.
- Nguyen, N.D.
- Nishimura, D.
- Ozawa, A.
- Ren, P.P.
- Sakaguchi, H.
- Tanaka, J.
- Takechi, M.
- Terashima, S.
- Wada, R.
- Yamamoto, T.
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ISSN: 2469-9993, 2469-9985
Datum der Publikation: 2016
Ausgabe: 94
Nummer: 6
Art: Artikel