Does the Threshold Voltage Extraction Method Affect Device Variability?

  1. Espineira, G.
  2. Garcia-Loureiro, A.J.
  3. Seoane, N.
Journal:
IEEE Journal of the Electron Devices Society

ISSN: 2168-6734

Year of publication: 2021

Volume: 9

Pages: 469-475

Type: Article

DOI: 10.1109/JEDS.2020.3046122 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus