What do we know about the defect types detected in conceptual models?
- Granda, M.F.
- Condori-Fernandez, N.
- Vos, T.E.J.
- Pastor, O.
ISSN: 2151-1357, 2151-1349
Ano de publicación: 2015
Volume: 2015-June
Número: June
Páxinas: 88-99
Tipo: Achega congreso
Actas:
Proceedings - International Conference on Research Challenges in Information Science