Growth and structural characterization of strained epitaxial H f0.5 Z r0.5 O2 thin films

  1. Torrejón, L.
  2. Langenberg, E.
  3. Magén, C.
  4. Larrea, Á.
  5. Blasco, J.
  6. Santiso, J.
  7. Algarabel, P.A.
  8. Pardo, J.A.
Journal:
Physical Review Materials

ISSN: 2475-9953

Year of publication: 2018

Volume: 2

Issue: 1

Type: Article

DOI: 10.1103/PHYSREVMATERIALS.2.013401 GOOGLE SCHOLAR
Data source: Scopus