Benchmarking of FinFET, Nanosheet, and Nanowire FET Architectures for Future Technology Nodes

  1. Nagy, D.
  2. Espineira, G.
  3. Indalecio, G.
  4. Garcia-Loureiro, A.J.
  5. Kalna, K.
  6. Seoane, N.
Journal:
IEEE Access

ISSN: 2169-3536

Year of publication: 2020

Volume: 8

Pages: 53196-53202

Type: Article

DOI: 10.1109/ACCESS.2020.2980925 GOOGLE SCHOLAR lock_openOpen access editor