Improved image quality in pinhole SPECT by accurate modeling of the point spread function in low magnification systems
- Pino, F.
- Roé, N.
- Aguiar, P.
- Falcon, C.
- Ros, D.
- Pavía, J.
ISSN: 0094-2405
Year of publication: 2015
Volume: 42
Issue: 2
Pages: 703-714
Type: Article