Impact of threshold voltage extraction methods on semiconductor device variability

  1. Espiñera, G.
  2. Nagy, D.
  3. García-Loureiro, A.
  4. Seoane, N.
  5. Indalecio, G.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2019

Volume: 159

Pages: 165-170

Type: Article

DOI: 10.1016/J.SSE.2019.03.055 GOOGLE SCHOLAR
Data source: Scopus