Vacuum annealing effect on physical properties and electrical circuit model of ZnO:Sn/SnO2:F bilayer structure
- Dabbabi, S.
- Souli, M.
- Ben Nasr, T.
- Garcia-Loureiro, A.
- Kamoun, N.
Journal:
Vacuum
ISSN: 0042-207X
Year of publication: 2019
Volume: 167
Pages: 416-420
Type: Article