FoMPy: A figure of merit extraction tool for semiconductor device simulations

  1. Espiñeira, G.
  2. Seoane, N.
  3. Nagy, D.
  4. Indalecio, G.
  5. García-Loureiro, A.J.
Proceedings:
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018

ISBN: 9781538648117

Year of publication: 2018

Volume: 2018-January

Pages: 1-4

Type: Conference paper

DOI: 10.1109/ULIS.2018.8354752 GOOGLE SCHOLAR
Data source: Scopus