Multi-subband interface roughness scattering using 2D finite element schodinger equation for monte carlo simulations of multi-gate transistors

  1. Nagy, D.
  2. Elmessary, M.A.
  3. Aldegunde, M.
  4. Lindberg, J.
  5. García-Loureiro, A.J.
  6. Kalna, K.
Actas:
18th International Workshop on Computational Electronics, IWCE 2015

ISBN: 9780692515235

Ano de publicación: 2015

Tipo: Achega congreso

DOI: 10.1109/IWCE.2015.7301977 GOOGLE SCHOLAR
Fonte de datos: Scopus