Characterization of the neutron induced single event upset in SRAM around high megavoltage clinical accelerators
- Jiménez-Ortega, E.
- Expósito, M.R.
- González-Soto, X.
- Terrón, J.A.
- Gómez, F.
- Sánchez-Doblado, F.
Konferenzberichte:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
ISBN: 9781457705878
Datum der Publikation: 2011
Seiten: 922-925
Art: Konferenz-Beitrag