Characterization of the neutron induced single event upset in SRAM around high megavoltage clinical accelerators

  1. Jiménez-Ortega, E.
  2. Expósito, M.R.
  3. González-Soto, X.
  4. Terrón, J.A.
  5. Gómez, F.
  6. Sánchez-Doblado, F.
Konferenzberichte:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN: 9781457705878

Datum der Publikation: 2011

Seiten: 922-925

Art: Konferenz-Beitrag

DOI: 10.1109/RADECS.2011.6131330 GOOGLE SCHOLAR