Study of surface roughness in extremely small Si nanowire MOSFETs using fully-3D NEGFs
- Seoane, N.
- Martinez, A.
- Brown, A.R.
- Asenov, A.
Proceedings:
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
ISBN: 9781424428397
Year of publication: 2009
Pages: 180-183
Type: Conference paper