A comparison between a fully-3D real-space versus coupled mode-space NEGF in the study of variability in gate-all-around Si nanowire MOSFET
- Martinez, A.
- Brown, A.R.
- Asenov, A.
- Seoane, N.
Actas:
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
ISBN: 9781424439492
Ano de publicación: 2009
Tipo: Achega congreso