Benchmarking of scaled InGaAs implant-free NanoMOSFETs

  1. Kalna, K.
  2. Seoane, N.
  3. García-Loureiro, A.J.
  4. Thayne, I.G.
  5. Asenov, A.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2008

Volume: 55

Issue: 9

Pages: 2297-2306

Type: Article

DOI: 10.1109/TED.2008.927658 GOOGLE SCHOLAR
Data source: Scopus