Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry
- Román, J.F.
- Moreno, V.
- Petzing, J.N.
- Tyrer, J.R.
ISSN: 0950-0340, 1362-3044
Year of publication: 2006
Volume: 53
Issue: 11
Pages: 1541-1559
Type: Article