Effect of mismatch on the reliability of binary-programmable CNNs

  1. Laiho, M.
  2. Paasio, A.
  3. Brea, V.
Proceedings:
Proceedings - IEEE International Symposium on Circuits and Systems

ISSN: 0271-4310

ISBN: 9780780393905

Year of publication: 2006

Pages: 3622-3625

Type: Conference paper

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Data source: Scopus