51 datos de investigación referenciados

Datos de investigación referenciados por Centro de Investigación en Tecnologías Inteligentes (CITIUS).

2024

  1. Additional file 1 of AI literacy in K-12: a systematic literature review

    figshare

  2. Additional file 1 of AI literacy in K-12: a systematic literature review

    figshare

  3. Data augmentation for Multi-Classification of Non-Functional Requirements - Dataset

    Zenodo

  4. Data augmentation for Multi-Classification of Non-Functional Requirements - Dataset

    Zenodo

  5. Multimodal Dataset for Predicting the Interruptibility of Office Workers

    Zenodo

  6. Multimodal Dataset for Predicting the Interruptibility of Office Workers

    Zenodo

  7. Nos_CorpusNOS-GL: Galician Macrocorpus for LLM training

    Zenodo

  8. Nos_CorpusNOS-GL: Galician Macrocorpus for LLM training

    Zenodo

  9. Nos_CorpusNOS-GL: Galician Macrocorpus for LLM training

    Zenodo

  10. Supporting data for "Efficient phylogenetic tree inference for massive taxonomic datasets: harnessing the power of a server to analyze one million taxa"

    GigaScience Database

  11. iRead4Skills Dataset 1: corpora by complexity level for FR, PT and SP

    Zenodo

  12. iRead4Skills Dataset 1: corpora by complexity level for FR, PT and SP

    Zenodo

  13. iRead4Skills Dataset 1: corpora by complexity level for FR, PT and SP

    Zenodo

  14. iRead4Skills Dataset 1: corpora by complexity level for FR, PT and SP

    Zenodo

  15. iRead4Skills Dataset 1: corpora by complexity level for FR, PT and SP

    Zenodo

  16. iRead4Skills Dataset 2: annotated corpora by level of complexity for FR, PT and SP

    Zenodo

  17. iRead4Skills Dataset 2: annotated corpora by level of complexity for FR, PT and SP

    Zenodo

  18. iRead4Skills Dataset 2: annotated corpora by level of complexity for FR, PT and SP

    Zenodo

2023

  1. Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability

    Zenodo

  2. Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability

    Zenodo