Intrinsic fluctuations induced by a high-kappa gate dielectric in sub-100 nm Si MOSFETs

  1. Garcia-Loureiro, AJ
  2. Kalna, K
  3. Asenov, A
Book Series:
NOISE AND FLUCTUATIONS
  1. Gonzalez, T (coord.)
  2. Mateos, J (coord.)
  3. Pardo, D (coord.)

ISSN: 0094-243X

ISBN: 0-7354-0267-1

Year of publication: 2005

Volume: 780

Pages: 239-242

Congress: 18th International Conference on Noise and Fluctuations

Type: Conference paper

GOOGLE SCHOLAR
Data source: WoS