Intrinsic fluctuations induced by a high-kappa gate dielectric in sub-100 nm Si MOSFETs
- Garcia-Loureiro, AJ
- Kalna, K
- Asenov, A
- Gonzalez, T (coord.)
- Mateos, J (coord.)
- Pardo, D (coord.)
ISSN: 0094-243X
ISBN: 0-7354-0267-1
Datum der Publikation: 2005
Ausgabe: 780
Seiten: 239-242
Kongress: 18th International Conference on Noise and Fluctuations
Art: Konferenz-Beitrag